The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Jan. 22, 2003
Applicant:
Lee Weng, Bellevue, WA (US);
Inventor:
Lee Weng, Bellevue, WA (US);
Assignee:
Microsoft Corporation, Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 31/00 (2006.01); G06G 7/48 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides improved ANOVA methods for analyzing measured data and transformed data. The improved ANOVA method takes two data types as its input, one is the measurements, the other is a predetermined error associated with the measurements. The latter can come from a technology/platform-specific error model. Because of the additional input information, the statistical power is increased. The methods of the invention is particularly useful for analyzing gene or protein expression data.