The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Jan. 12, 2009
Applicants:

Youxiang (Julian) Zuo, Edmonton, CA;

Oliver C. Mullins, Ridgefield, CT (US);

Jinglin Gao, Edmonton, CA;

Abdel M. Kharrat, Edmonton, CA;

Kentaro Indo, Edmonton, CA;

Michael O'keefe, Blackmans Bay, AU;

Soraya S. Betancourt, Cambridge, MA (US);

Chengli Dong, Sugar Land, TX (US);

Francois Dubost, Idron, FR;

Inventors:

Youxiang (Julian) Zuo, Edmonton, CA;

Oliver C. Mullins, Ridgefield, CT (US);

Jinglin Gao, Edmonton, CA;

Abdel M. Kharrat, Edmonton, CA;

Kentaro Indo, Edmonton, CA;

Michael O'Keefe, Blackmans Bay, AU;

Soraya S. Betancourt, Cambridge, MA (US);

Chengli Dong, Sugar Land, TX (US);

Francois Dubost, Idron, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/40 (2006.01); G01V 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for characterizing asphaltene gradients of a reservoir of interest and analyzing properties of the reservoir of interest based upon such asphaltene gradients. The analysis employs a correlation that relates insoluble asphaltene concentration to spectrophotometry measurement data measured at depth.


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