The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Feb. 21, 2003
Applicant:

Todd L. Mendenhall, Rancho Palos Verdes, CA (US);

Inventor:

Todd L. Mendenhall, Rancho Palos Verdes, CA (US);

Assignee:

Northrop Grumman Systems Corporation, Los Angeles, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scan acquisition technique for acquiring terminals () that does not rely on precise alignment between a sensor () and a transmitter () associated with the terminals (). The terminals () separate uncertainty regions () into a plurality of sections (). Scan beams () include encoded information of what section () the scan beam () is currently scanning. Each terminal () will eventually receive the scan beam () of the other terminal (). When it does, it will encode its scan beam () with both the outgoing code and the return code for that section (), so that when it's scan beam () is received by the other terminal (), that terminal () will know what scan section () the other terminal () is located.


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