The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7995703 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 09, 2011

Filed:

Dec. 23, 2008
Applicant:

Xiongwei Yan, Beijing, CN;

Inventor:

Xiongwei Yan, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/10 (2006.01); H05G 1/34 (2006.01); G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for controlling automatic X-ray exposure in an X-ray CT system includes establishing a correspondence table or function relationship between a ratio factor and an offset of a geometrical center of a scanned section, wherein the ratio factor represents a ratio of the projection area value when the geometrical center of the scanned section of a subject deviates from a rotation center to the standard projection area value when the geometrical center of the scanned section of the subject locates at the rotation center, scout scanning the subject, and calculating a 'measured projection area value' and Projection Measure based on the scout scan data, calculating the offset of the geometrical center of the scanned section from the rotation center, substituting the offset into the correspondence table or function relationship to obtain a corresponding ratio factor, calculating the standard projection area value based on the ratio factor and the measured projection area value, and automatically determining by an automatic exposure function a tube current value required for exposure based on the calculated standard projection area value, the Projection Measure.


Find Patent Forward Citations

Yan, Xiongwei. (2011). Method for controlling x-ray exposure in x-ray ct system (U.S. Patent No. 7995703). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7995703

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