The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Jan. 27, 2006
Applicants:

John D. Fite, Clifton, VA (US);

John W. Betz, Bedford, MA (US);

Inventors:

John D. Fite, Clifton, VA (US);

John W. Betz, Bedford, MA (US);

Assignee:

The MITRE Corporation, McLean, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to methods and systems for enhanced signal acquisition through cross-ambiguity function (CAF) interpolation. In one aspect, the present invention provides methods and systems for CAF interpolation. In an embodiment, a first CAF generated using a low input sampling rate (e.g., 1 sample/chip) is interpolated to generate a second CAF having a higher sample per chip rate. By lowering the initial input sampling rate, cost and complexity of initial synchronization processing can be significantly reduced at the receiver. In another aspect, coherent and non-coherent interpolation methods and systems are provided for time and frequency CAF interpolation. Low cost and low complexity implementations of these methods and systems are also provided with associated CAF peak detection methods and systems.


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