The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Feb. 07, 2008
Kyeongho Lee, Seoul, KR;
Joonbae Park, Seoul, KR;
Jeong Woo Lee, Seoul, KR;
Seung-wook Lee, Seoul, KR;
Eal Wan Lee, Seoul, KR;
Kyeongho Lee, Seoul, KR;
Joonbae Park, Seoul, KR;
Jeong Woo Lee, Seoul, KR;
Seung-Wook Lee, Seoul, KR;
Eal Wan Lee, Seoul, KR;
GCT Semiconductor, Inc., San Jose, CA (US);
Abstract
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a signal generator can provide a first IQ signal of a DC component during a first period and the first IQ signal of a first angular frequency during a second period, an IQ up-conversion mixer can up-convert the first IQ signal by a second angular frequency during the first period and up-convert the first IQ signal by a third angular frequency during the second period to output a second IQ signal, an IQ down-conversion mixer can down-convert the second IQ signal by the third angular frequency to output a third IQ signal and an IQ imbalance detector can obtain a first IQ imbalance (e.g., Rx IQ imbalance) from the third IQ signal during the first period and a second IQ imbalance (e.g., Tx/Rx IQ imbalance) during the second period.