The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Nov. 18, 2008
Peter Miller, Cambridge, MA (US);
David Fletcher-holmes, Boston, MA (US);
Cathy M. Boutin, New Ipswich, NH (US);
Clifford Hoyt, Wellesley, MA (US);
Peter Miller, Cambridge, MA (US);
David Fletcher-Holmes, Boston, MA (US);
Cathy M. Boutin, New Ipswich, NH (US);
Clifford Hoyt, Wellesley, MA (US);
Cambridge Research & Instrumentation, Inc., Woburn, MA (US);
Abstract
Apparatus and methods are disclosed for viewing low-birefringence structures within samples directly, with the eye, in real-time. The sample is placed between an entrance polarizer and analyzer polarizer, the transmission state of one of which is changed dynamically to create a modulated view of the scene; against this background, birefringent structures are visible because of their different appearance when modulated. Modulation rates of 4 or more states per second; use of 4 or more states, or even a continuum of states, which lie substantially on a latitude line on the Poincare sphere; and orientation of the polarization components to produce a uniform background; produce a clear view that does not produce operator fatigue. Broad-band wavelength operation spanning 50 nm or more, or the whole visible range, is achieved, and it is compatible with integration into other microscopy modes such as Hoffman relief contrast.