The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Oct. 23, 2008
Applicant:

Daisuke Matsumoto, Kyoto, JP;

Inventor:

Daisuke Matsumoto, Kyoto, JP;

Assignee:

Arkray, Inc., , JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzer in which optical measurement is performed with respect to a sample placed in optically transparent cells of an analysis tool includes a light source unit, a light-receiving unit, a tray on which the tool is placed, and a drive mechanism for driving the tray. The tray includes a holding section that holds the tool in a predetermined position. The drive mechanism reciprocates the tray between a first position where the tool placed on the tray is exposed to the outside of the analyzer and a second position where the tool is accommodated inside the analyzer. The light source unit is disposed so that emitted light is incident on a cell of the tool when the tray is located in the second position. The light-receiving unit is disposed so as to receive light transmitted through the cell when the tray is located in the second position.


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