The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Jul. 29, 2008
Heinrich Feichtinger, Hinteregg, CH;
Gottfried Rohner, Altstätten, CH;
Rudolf Jussel, Feldkirch-Tosters, AT;
Heinrich Feichtinger, Hinteregg, CH;
Gottfried Rohner, Altstätten, CH;
Rudolf Jussel, Feldkirch-Tosters, AT;
Ivoclar Vivadent AG, Schaan, LI;
Abstract
The invention relates to a method for optically monitoring the progression of a physical and/or chemical process taking place on a surface of a body in which the surface radiation which emanates from part of the surface during the physical and/or chemical process, is measured with the aid of a measuring device, in particular a sensor. In order to develop a method of this kind such that sintering processes can also be monitored in a firing furnace having thermal radiation equilibrium, the invention proposes to emit the radiation () having a radiation spectrum that differs from the surface radiation, to the surface () by means of a radiation source () and to measure the radiation with the aid of a measuring device ().