The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Oct. 16, 2007
Applicants:

Mitsunori Imade, Osaka, JP;

Hajime Imai, Osaka, JP;

Hideki Kitagawa, Osaka, JP;

Tetsuo Kikuchi, Osaka, JP;

Yoshihito Hara, Osaka, JP;

Junya Shimada, Osaka, JP;

Inventors:

Mitsunori Imade, Osaka, JP;

Hajime Imai, Osaka, JP;

Hideki Kitagawa, Osaka, JP;

Tetsuo Kikuchi, Osaka, JP;

Yoshihito Hara, Osaka, JP;

Junya Shimada, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01);
U.S. Cl.
CPC ...
Abstract

A transflective-type and a reflection-type liquid crystal display device having a high reflection efficiency and a high image quality are provided. A liquid crystal display device of the present invention is a liquid crystal display device including a reflection region, wherein the reflection region includes an insulating layer, a semiconductor layer and a reflective layer formed on a metal layer having a plurality of recesses therein; a plurality of protrusions of the metal layer, each having a bottom surface, an upper surface and a slope, are formed between the plurality of recesses of the metal layer; and a width a of a bottom surface of at least one of the plurality of protrusions in the metal layer satisfies a≦2(x+y)/tan θ, where a denotes the width of the bottom surface of each of the plurality of protrusions, x a thickness between the bottom surface and the upper surface, θ a tilt angle of the slope with respect to the bottom surface, and y a total thickness of the insulating layer, the semiconductor layer and the reflective layer.


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