The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Sep. 11, 2006
Gary Robert Pedeville, Duvall, WA (US);
Ronald F. Rykowski, Woodinville, WA (US);
Gary Robert Pedeville, Duvall, WA (US);
Ronald F. Rykowski, Woodinville, WA (US);
Radiant Imaging, Inc., Duvall, WA (US);
Abstract
Systems and methods for measuring spatial and angular performance of a visual display are disclosed herein. In one particular embodiment, for example, a method for measuring spatial and angular performance of a flat panel visual display includes capturing a plurality of image measurements from a visual display at a plurality of different view angles. The method also includes selecting one or more points of interest on the visual display, and calculating tristimulus values (X, Y, Z) for each point of interest at each of the plurality of view angles. The method further includes generating a view angle performance plot for the one or more selected points of interest.