The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Jul. 23, 2007
Hisataka Sugiyama, Kodaira, JP;
Takeshi Maeda, Kokubunji, JP;
Kiyoshi Matsumoto, Kokubunji, JP;
Motoyasu Terao, Tokyo, JP;
Shigenori Okamine, Kodaira, JP;
Tetsuya Nishida, Hachioji, JP;
Harukazu Miyamoto, Kodaira, JP;
Hisataka Sugiyama, Kodaira, JP;
Takeshi Maeda, Kokubunji, JP;
Kiyoshi Matsumoto, Kokubunji, JP;
Motoyasu Terao, Tokyo, JP;
Shigenori Okamine, Kodaira, JP;
Tetsuya Nishida, Hachioji, JP;
Harukazu Miyamoto, Kodaira, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A recording medium including a plurality of recording layers, including: an optional first recording layer on which a light spot at a diffraction limit is formed; and a second recording layer on which a mark string pattern is formed, said second recording layer being different from said first recording layer, wherein when said mark string pattern is formed on a light receiving plane, while information of said first recording layer is reproduced, assuming that an optical distance between said first and second recording layers is dm, an optical distance d between optional two recording layers among a plurality of said recording layers is different from said dm.