The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Mar. 09, 2010
Applicants:

Young-hoon Sohn, Suwon-si, KR;

Kwang-il Park, Yongin-si, KR;

Yong-gwon Jeong, Uiwang-si, KR;

Si-hong Kim, Gunpo-si, KR;

Inventors:

Young-Hoon Sohn, Suwon-si, KR;

Kwang-Il Park, Yongin-si, KR;

Yong-Gwon Jeong, Uiwang-si, KR;

Si-Hong Kim, Gunpo-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/0175 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device includes a plurality of pads, where an external reference resistor is connected to a first one of the pads, an impedance calibrating unit configured to generate an impedance calibration code corresponding to an impedance of the reference resistor and output the impedance calibration code to a code transmitting line during a normal operating mode, and an impedance matching unit configured to perform an impedance matching operation in response to the impedance calibration code during the normal operating mode. The impedance calibrating unit is configured to output a test code to the code transmitting line in response to a test signal during a test operating mode. The impedance matching unit is configured to serialize the test code to output the serialized test code to each of the other pads in response to the test signal during the test operating mode.


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