The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Jun. 16, 2008
Applicants:

Hideo Matsumura, Iwate, JP;

Ryohei Terauchi, Iwate, JP;

Inventors:

Hideo Matsumura, Iwate, JP;

Ryohei Terauchi, Iwate, JP;

Assignee:

Iwate Prefectural Government, Morioka-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides a method of gene expression analysis that enables extensive gene expression analysis and simultaneous analysis of multiple samples of organisms for which genomic analysis has not yet been advanced. In this method, tags each comprising an oligonucleotide of more than 25 bp for identifying expressed genes, wherein the 3'-end of the tag is defined by a cleavage site of a type III restriction enzyme and the 5′-end thereof is defined by a cleavage site of another restriction enzyme located closest to the 3′-end of the cDNA of such genes, are immobilized on a solid support, gene-containing samples are hybridized to the solid support, and the signals emitted from the genes hybridized to the tags are detected to analyze the gene expression profiles in the samples.


Find Patent Forward Citations

Loading…