The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2011

Filed:

Oct. 17, 2008
Applicants:

Friedrich-karl Bruder, Krefeld, DE;

Wilfried Haese, Odenthal, DE;

Rafael Oser, Krefeld, DE;

Jan Wiekard, Ordenthal-Erberich, DE;

Wolfgang Fischer, Meerbusch, DE;

Rainer Protte, Dormagen, DE;

Joerg Wehrle, Remagen, DE;

Karlheinz Hildenbrand, Krefeld, DE;

Inventors:

Friedrich-Karl Bruder, Krefeld, DE;

Wilfried Haese, Odenthal, DE;

Rafael Oser, Krefeld, DE;

Jan Wiekard, Ordenthal-Erberich, DE;

Wolfgang Fischer, Meerbusch, DE;

Rainer Protte, Dormagen, DE;

Joerg Wehrle, Remagen, DE;

Karlheinz Hildenbrand, Krefeld, DE;

Assignee:

Bayer MaterialScience AG, Leverkusen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Optical recording mediums comprising a substrate and a recording layer and a light transmitting layer sequentially disposed on the substrate; wherein the substrate comprises one or more parts selected from the group consisting of injection molded parts, injection molded sandwich structures having a molded surface layer and a molded core layer or two injection molded parts which are UV-bonded, and combinations thereof; and wherein the substrate has a Young's modulus E of at least 2.15 GPa and a Q factor of lower than 160 measured at 25° C. at 2000 Hz in accordance to ASTM E 756-05.


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