The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Sep. 09, 2010
Roland Bergner, Jena, DE;
Ingo Koschmieder, Jena, DE;
Wilfried Bissmann, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
An ophthalmological measuring system for obtaining biometric data of an eye with a view to the pre-operative determination of a replacement lens or supplementary lens or refractive operations. The invention includes a combination of a measuring instrument based on ultrasound, an optical measuring instrument, and an evaluation unit, measuring values of the optical measuring instrument and/or of the measuring instrument based on ultrasound being used by the evaluation unit for determining the biometric data of an eye. Furthermore, keratometric and/or pachymetric measurements can also be carried out. The combination of different measuring systems enables a complete examination or diagnosis of a patient on a measuring table, so that the patient does not need to be moved, or have to come back at a later date for more measurements.