The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2011
Filed:
Nov. 30, 2006
Applicants:
Torsten Fritzel, Munich, DE;
Hans-juergen Steiner, Munich, DE;
Inventors:
Torsten Fritzel, Munich, DE;
Hans-Juergen Steiner, Munich, DE;
Assignee:
Astrium GmbH, Taufkirchen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); E04H 5/02 (2006.01); H01Q 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A high-frequency measuring enclosure for measuring large test objects is formed by an air-supported membrane or textile construction of a spherical or ellipsoidal contour, which is substantially pervious to electromagnetic radiation. For absorption of residual electromagnetic radiation that may be reflected by the interior of the surface, the floor is covered with absorber material.