The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Dec. 07, 2008
Applicants:

Su-kuang Yang, Taipei Hsien, TW;

Chien-hung Lo, Taipei Hsien, TW;

Min-fu Deng, Shenzhen, CN;

Zheng-quan Peng, Shenzhen, CN;

Xiang Cao, Shenzhen, CN;

Inventors:

Su-Kuang Yang, Taipei Hsien, TW;

Chien-Hung Lo, Taipei Hsien, TW;

Min-Fu Deng, Shenzhen, CN;

Zheng-Quan Peng, Shenzhen, CN;

Xiang Cao, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test system for testing various functions of electronic devices includes a master device and a simulation control device. The master device is connected to an input device and the electronic devices through the simulation control device. The master device records input signals of the input device and generate simulation signals according to the input signals. The simulation control device simulates the input signals of the input device according to the simulation signals to test the electronic devices.


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