The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Apr. 13, 2007
Applicants:

Robert Joseph Bestgen, Rochester, MN (US);

Michael S. Faunce, Rochester, MN (US);

Wei HU, Rochester, MN (US);

Shantan Kethireddy, Rochester, MN (US);

Andrew Peter Passe, Rochester, MN (US);

Ulrich Thiemann, Rochester, MN (US);

Inventors:

Robert Joseph Bestgen, Rochester, MN (US);

Michael S. Faunce, Rochester, MN (US);

Wei Hu, Rochester, MN (US);

Shantan Kethireddy, Rochester, MN (US);

Andrew Peter Passe, Rochester, MN (US);

Ulrich Thiemann, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus and program product to optimize a database query. In a first system having a first dataspace, a query plan is generated for the database query. Remote statistics collection associated with the database query is initiated on a second system having a second dataspace. The remote statistics collection uses the second dataspace, which includes a current copy of at least a portion of the first dataspace on the first system. Database statistics are collected for the first system by analyzing the second dataspace and then communicating the collected database statistics to the first system for use in optimizing database queries executed by the first system.


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