The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Feb. 01, 2006
Matthieu Bal, Aachen, DE;
Hasan Celik, Oyonnax, FR;
Kai Eck, Aachen, DE;
Lothar Spies, Aachen, DE;
Krishna Subramanyan, Solon, OH (US);
Matthieu Bal, Aachen, DE;
Hasan Celik, Oyonnax, FR;
Kai Eck, Aachen, DE;
Lothar Spies, Aachen, DE;
Krishna Subramanyan, Solon, OH (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A diagnostic imaging system () corrects metal artifact streaks () emanating from a metal object () in a tomographic image (T). A first processor () reduces streaks () caused by mild artifacts by applying an adaptive filter (). The filter () is perpendicularly oriented toward the center of the metal object (). The weight of the filter () is a function of the local structure tensor and the vector pointing to the metal object (). If it is determined that the strong artifacts are present in the image, a second processor () applies a sinogram completed image algorithm to correct for severe artifacts in the image. The sinogram completed image and adaptively filtered image are fused to a final corrected image. In the fusion process, highly corrupted tomographic regions are replaced by the result of the sinogram completed image and the remainder is replaced by the adaptively filtered image.