The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Aug. 22, 2006
Applicants:

Qiong Yang, Beijing, CN;

Dian Gong, Beijing, CN;

Xiaoou Tang, Beijing, CN;

Inventors:

Qiong Yang, Beijing, CN;

Dian Gong, Beijing, CN;

Xiaoou Tang, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Exemplary systems and methods use micro-structure modeling of an image for extracting image features. The micro-structure in an image is modeled as a Markov Random Field, and the model parameters are learned from training images. Micro-patterns adaptively designed from the modeled micro-structure capture spatial contexts of the image. In one implementation, a series of micro-patterns based on the modeled micro-structure can be automatically designed for each block of the image, providing improved feature extraction and recognition because of adaptability to various images, various pixel attributes, and various sites within an image.


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