The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Jun. 26, 2008
Applicants:

Tomoyuki Sadakane, Kyoto, JP;

Takahiro Yoshimura, Kyoto, JP;

Inventors:

Tomoyuki Sadakane, Kyoto, JP;

Takahiro Yoshimura, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray CT apparatus with a function of taking in an X-ray image data obtained by another X-ray apparatus, for use of scout view for a CT for local region of an object to be examined. The apparatus comprises an image data input means for taking in an X-ray image data as obtained by an X-ray detector of another X-ray apparatus by way of such as data importing, together with the attribute information thereon, a display operation means for displaying the X-ray image data as a scout view and receiving the operation of designating an interested area on the X-ray image; and a position control means for relatively moving the object to be examined, relative to the X-ray generator and the X-ray detector, in order to execute a CT for local region of the interested area of the object, based on the operation for the X-ray image displayed as the scout view with the display operation means or the attribute information.


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