The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
May. 10, 2004
Data sampling method and apparatus using through-transition counts to reject worst sampling position
Bruce Kim, Los Altos, CA (US);
Hoon Choi, Mountain View, CA (US);
Gyudong Kim, Sunnyvale, CA (US);
Silicon Image, Inc., Sunnyvale, CA (US);
Abstract
A data sampling circuit that employs an oversampling clock to oversample a data signal, a phase tracking circuit for use in such a sampling circuit, and a receiver and system including such a sampling circuit. Preferably, phase tracking is implemented by systematically identifying and rejecting at least one worst sampling position, and sampling the data signal at a non-rejected sampling position. Preferably, phase tracking is accomplished by counting through-transitions of edges of the sampled data signal through each oversampling position, and rejecting an oversampling position having a highest count of through-transitions. In some embodiments, different phase tracking methods (at least one of which includes the step of generating through-transition counts) are used for different types of input data. Other aspects of the invention are methods for determining an oversampling position for oversampling a data signal, and methods for oversampling a data signal including by generating through-transition counts.