The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Dec. 21, 2005
Koji Setoh, Osaka, JP;
Ippei Kanno, Kyoto, JP;
Akira Kisoda, Osaka, JP;
Daisuke Hayashi, Osaka, JP;
Ryosuke Mori, Osaka, JP;
Tetsuya Yagi, Osaka, JP;
Noritaka Iguchi, Osaka, JP;
Koji Setoh, Osaka, JP;
Ippei Kanno, Kyoto, JP;
Akira Kisoda, Osaka, JP;
Daisuke Hayashi, Osaka, JP;
Ryosuke Mori, Osaka, JP;
Tetsuya Yagi, Osaka, JP;
Noritaka Iguchi, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An OFDM reception device detects a time at which impulse noise occurs in a received OFDM signal, and specifies a start position candidate period that does not have intersymbol interference and is estimated to have a guard interval signal in a symbol. When setting a FFT window of an effective symbol length in a symbol duration of each symbol, if the impulse noise occurrence time is included in the symbol, the OFDM reception device determines a start position of the FFT window within a range of the start position candidate period so as to exclude the impulse noise occurrence time as much as possible.