The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Sep. 12, 2008
Robert W. Boyd, Webster, NY (US);
Daniel J. Gauthier, Durham, NC (US);
Zhimin Shi, Rochester, NY (US);
Robert W. Boyd, Webster, NY (US);
Daniel J. Gauthier, Durham, NC (US);
Zhimin Shi, Rochester, NY (US);
University of Rochester, Rochester, NY (US);
Duke University, Durham, NC (US);
Abstract
According to the invention, a highly optically dispersive medium is one in which the absolute value of the group index of refraction of the medium is equal to or greater than four. An optical spectroscopic parameter detection and/or measurement apparatus may be in the form of an interferometer, a spectral interferometer, a spectrometer, a wavemeter, a tunable narrowband filter The embodied devices include a highly dispersive medium that appropriately can facilitate either a slow-light effect or a fast-light effect, which is disposed in a propagation path of an electro-magnetic (EM) input field and, a detector disposed in a manner to detect an output field resulting from the input filed interaction with the highly dispersive medium. Methods involve measuring a spectroscopic parameter using an optical spectroscopic parameter detection and/or measurement apparatus that incorporates a highly dispersive medium.