The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Apr. 13, 2007
Applicants:

Jean-francois Pelletier, Los Angeles, CA (US);

Gregory Niles, Culver City, CA (US);

Stephen Sheeler, Santa Monica, CA (US);

William Stein, Hillsborough, CA (US);

Inventors:

Jean-Francois Pelletier, Los Angeles, CA (US);

Gregory Niles, Culver City, CA (US);

Stephen Sheeler, Santa Monica, CA (US);

William Stein, Hillsborough, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G06T 13/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Computer-implemented methods and media bearing instructions for matching movements of objects are described. In one example, the method can include determining a position of a first point in a first coordinate system, converting the position of the first point from the first coordinate system to a second coordinate system, performing a transformation on a second point in the second coordinate system, wherein the second point is initialized to a starting position in the second coordinate system, determining an ending position of the second point in the second coordinate system based on the transformation, converting the ending position of the second point in the second coordinate system to the first coordinate system, and associating the ending position of the second point in the first coordinate system to the first point in the first coordinate system, wherein the associating causes a transformation of the first point to match the transformation performed on the second point.


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