The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Dec. 10, 2007
Meir Bar-zohar, Haifa, IL;
Avi Yaron, Tenafly, NJ (US);
Meir Bar-Zohar, Haifa, IL;
Avi Yaron, Tenafly, NJ (US);
Visionsense Ltd., Petah Tikva, IL;
Abstract
Method for determining a disparity value of a disparity of each of a plurality of points on an object, the method including the procedures of detecting by a single image detector, a first image of the object through a first aperture, and a second image of the object through a second aperture, correcting the distortion of the first image, and the distortion of the second image, by applying an image distortion correction model to the first image and to the second image, respectively, thereby producing a first distortion-corrected image and a second distortion-corrected image, respectively, for each of a plurality of pixels in at least a portion of the first distortion-corrected image representing a selected one of the points, identifying a matching pixel in the second distortion-corrected image, and determining the disparity value according to the coordinates of each of the pixels and of the respective matching pixel.