The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Sep. 09, 2009
Applicant:
Rikizo Nakano, Kawasaki, JP;
Inventor:
Rikizo Nakano, Kawasaki, JP;
Assignee:
Fujitsu Limited, Kawasaki, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/34 (2006.01);
U.S. Cl.
CPC ...
Abstract
An electronic device test method incorporating a stress application step that is effective in screening out infant mortality failures of an electronic device. More specifically, a method for testing an electronic device constructed from a single or a plurality of semiconductor components, includes: turning a power supply on and off repeatedly while changing the ON/OFF cycle and/or voltage value of the power supply that is connected to the electronic device; and verifying whether or not the electronic device operates normally after the power supply has been turned on and off repeatedly.