The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Feb. 19, 2010
Applicants:

Jong-hoon Kim, Hwaseong-si, KR;

Hyun-ae Lee, Suwon-si, KR;

Jin-ho SO, Seongnam-si, KR;

Kwang-soo Park, Suwon-si, KR;

Inventors:

Jong-hoon Kim, Hwaseong-si, KR;

Hyun-ae Lee, Suwon-si, KR;

Jin-ho So, Seongnam-si, KR;

Kwang-soo Park, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe card to connect a semiconductor device to test equipment includes a Printed Circuit Board (PCB) in which an electrical wiring pattern is formed, a first connector fixed on an upper surface of the PCB to connect the test equipment to the PCB, probe needles connected to electrode pads of the semiconductor device, and a Flexible PCB (FPCB) to connect the PCB to the probe needles. Accordingly, a signal transmission characteristic can be enhanced, test expenses can be reduced, and ground noise can be reduced.


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