The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2011

Filed:

Jul. 12, 2006
Applicants:

Yoshihisa Soeda, Kanagawa, JP;

Norio Yamada, Saitama, JP;

Yoshinobu Kagami, Kanagawa, JP;

Osamu Inage, Kanagawa, JP;

Kenichi Satoh, Miyagi, JP;

Atsushi Ikeda, Miyagi, JP;

Inventors:

Yoshihisa Soeda, Kanagawa, JP;

Norio Yamada, Saitama, JP;

Yoshinobu Kagami, Kanagawa, JP;

Osamu Inage, Kanagawa, JP;

Kenichi Satoh, Miyagi, JP;

Atsushi Ikeda, Miyagi, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G01N 21/88 (2006.01); H04N 5/217 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A level detecting part detects image data levels for the respective output directions of the first half and the second half to be used for the linearity correction, which image data levels correspond to image data around a connection point between the first half and the second half and are obtained from respective combinations for the respective output directions of the first half and the second half. A calculating part calculates linearity correction values or correction value calculating parameters from the detected image data levels for any one of the first half and the second half; and a defect detection part detecting a defect in the image data levels thus detected around the connection point are provided.


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