The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
May. 04, 2006
Boris Regaard, Ypsilanti, MI (US);
Boris Regaard, Ypsilanti, MI (US);
Abstract
The present invention relates to a method for determining a lateral relative movement between a processing head and a workpiece during processing the workpiece as well as a device to carry it out. In the method a surface of the workpiece () is illuminated in the region of the processing head with an optical radiation (). The optical radiation () reflected from the surface of the workpiece () in the region of the processing head is repeatedly detected in a locally resolved manner by an optical detector (), which is firmly fixed mechanically to the processing head, to obtain optical reflection patterns. The repeated detection occurs in temporal intervals in which the temporally successive reflection patterns of overlapping surface regions of the workpiece () are obtained. The lateral relative movement is determined by comparing the temporally successive reflection patterns. The method and the corresponding device permit contactless measurement of the relative movement between the processing head and the workpiece with great precision.