The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7989145 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 02, 2011

Filed:

Dec. 26, 2007
Applicants:

Ki Lyoung Lee, Hwaseong-si, KR;

Cheol Kyu Bok, Icheon-si, KR;

Inventors:

Ki Lyoung Lee, Hwaseong-si, KR;

Cheol Kyu Bok, Icheon-si, KR;

Assignee:

Hynix Semiconductor Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for forming a fine pattern of a semiconductor device comprises forming a spin-on-carbon layer over an underlying layer, forming an anti-reflection pattern including a silicon containing polymer with a first etching mask pattern, forming a photoresist pattern including a silicon containing polymer with a second etching mask pattern between elements of the first etching mask pattern, and etching the spin-on-carbon layer with the etching mask patterns to reduce the process steps and the manufacturing cost, thereby obtaining a uniform pattern profile.


Find Patent Forward Citations

Lee, Ki. (2011). Method for forming fine pattern of semiconductor device (U.S. Patent No. 7989145). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7989145

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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