The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Oct. 28, 2009
Thomas D. Raymond, Edgewood, NM (US);
John G. Dixson, Albuquerque, NM (US);
Stephen W. Farrer, Albuquerque, NM (US);
Wei Xiong, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
John G. Dixson, Albuquerque, NM (US);
Stephen W. Farrer, Albuquerque, NM (US);
Wei Xiong, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
AMO Wavefront Sciences LLC., Santa Ana, CA (US);
Abstract
A method of determining a wavefront of a received light beam includes: (a) receiving a light beam; (b) producing a group of light spots from the light beam; (c) qualifying a set of the light spots for use in determining a wavefront of the received light beam; and (d) determining the wavefront of the received light beam using the qualified set of light spots. Qualifying the set of light spots includes, for each light spot: calculating a first calculated location of the light spot using a first calculation algorithm; calculating a second calculated location of the light spot using a second calculation algorithm; and when a difference between the first and second calculated locations for the light spot is greater than an agreement threshold, excluding the light spot from the set of light spots and/or from being employed in determining the wavefront of the received light beam.