The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Dec. 31, 2008
Charles E. Campbell, Berkeley, CA (US);
Stephen W. Farrer, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
William S. Powers, Albuquerque, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
James Copland, Albuquerque, NM (US);
Charles E. Campbell, Berkeley, CA (US);
Stephen W. Farrer, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, NM (US);
William S. Powers, Albuquerque, NM (US);
Thomas D. Raymond, Edgewood, NM (US);
James Copland, Albuquerque, NM (US);
AMO Wavefront Sciences LLC., Santa Ana, CA (US);
Abstract
A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.