The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2011
Filed:
Jul. 24, 2006
Valery Risson, Barcelona, ES;
Roma Segura Fabregas, Barcelona, ES;
Alejandro Manuel DE Pena, Barcelona, ES;
Valery Risson, Barcelona, ES;
Roma Segura Fabregas, Barcelona, ES;
Alejandro Manuel De Pena, Barcelona, ES;
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
The invention relates to a method of estimating the alignment in the printing medium direction between a first and a second pen of a printing system having a scan axis, whereby: the first, respectively second pen prints a first, respectively second pattern element; the first and second pattern elements are substantially aligned and separated by a space along the scan axis; each of the first and second pattern elements comprises a first and an associated second mark separated by a blank along the scan axis, the first and the second marks being staggered in the printing medium direction; an optical sensor scans along the scan axis over the first and second pattern elements, an analysis of the sensor output leading to estimating the alignment.