The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2011
Filed:
Nov. 23, 2005
Oliver Lange, Bremen, DE;
Michael W. Senko, Sunnyvale, CA (US);
Oliver Lange, Bremen, DE;
Michael W. Senko, Sunnyvale, CA (US);
Thermo Finnigan LLC, San Jose, CA (US);
Abstract
A method of processing Fourier Transform Mass Spectrometry (FTMS) data includes performing a Fourier Transform of a part of a time domain transient and identifying from that transformed data signal peaks representative of the presence of ions. After peak identification, the full transient is then transformed, and the peaks identified in the partial transient transform are used to locate true peaks in the transformed full transient. The number of 'false' peaks resulting from random noise has been found to correlate to the resolution, so that using a partial transient to identify true peaks reduces the risk of false peaks being included; nevertheless this information can then be applied to the full data set when transformed. As an alternative, different parts of the full data set can be transformed and then correlated; because any noise will be random, false peaks should occur at different places in the two partial transforms.