The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2011

Filed:

Jul. 06, 2005
Applicants:

Yihong Qi, Tokyo, JP;

Ryuji Kohno, Tokyo, JP;

Inventors:

Yihong Qi, Tokyo, JP;

Ryuji Kohno, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Delay estimation apparatus and method, comprising: a correlation step which a correlation function between a received signal and a supplied template waveform is generated, AD conversion step at which said correlation output generated at said correlation step is uniformly sampled into discrete samples; and arithmetic operation step at which a time delay estimate of the received signal based on said discrete samples generated at said AD conversion step is computed, wherein a selection criterion depending on the digital sampling frequency used at said AD conversion means is checked, if said selection criterion is satisfied, computes the time delay estimate based on the direct pick method, and if said selection criterion does not hold, computes the time delay estimate based on the simplified maximum likelihood (ML) method.


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