The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2011

Filed:

Jul. 21, 2009
Applicants:

Frank Thiel, Ober Ramstadt, DE;

Joachim Pfeiffer, Bensheim, DE;

Peter Fornoff, Reichelsheim, DE;

Inventors:

Frank Thiel, Ober Ramstadt, DE;

Joachim Pfeiffer, Bensheim, DE;

Peter Fornoff, Reichelsheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an apparatus and a method for optical 3D measurement, comprising a first beam deflector for deflecting an illuminating beam onto a measurement object and for deflecting the observation beam which is radiated back by the measurement object, wherein the first beam deflector can move along a path distance S.


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