The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2011
Filed:
May. 31, 2006
Applicant:
Michael Ganser, Giessen, DE;
Inventor:
Michael Ganser, Giessen, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope system and an image production method utilizing a microscope having one or more setting elements for modifying at least one microscope setting, and a camera for acquiring a microscope image, which camera is operable in predeterminable image modes. At least one of the setting elements of the microscope is operatively connected to the camera in such a way that a specific image mode of the camera is settable as a function of a modification of the microscope setting. Alternatively or additionally, a microscope setting can be modified as a function of an image mode of the camera that is present.