The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2011
Filed:
Nov. 07, 2008
Can-ming HU, Winnipeg, CA;
Nikolai Mecking, Achterwehr, DE;
Yongsheng Gui, Winnipeg, CA;
Andre Wirthmann, Winnipeg, CA;
Lihui Bai, Miyagi, JP;
Can-Ming Hu, Winnipeg, CA;
Nikolai Mecking, Achterwehr, DE;
Yongsheng Gui, Winnipeg, CA;
Andre Wirthmann, Winnipeg, CA;
Lihui Bai, Miyagi, JP;
University of Manitoba, Winnipeg, CA;
Abstract
Systems and methods for RF magnetic-field vector detection based on spin rectification effects are described. In one embodiment, a method comprises sweeping a quasi-static external applied magnetic field at a h-vector detector, measuring voltages across terminals of the h-vector detector when the detector receives a microwave, varying the angle between the external applied static magnetic field and the RF current, determining an angular dependence of the measured voltages, and calculating a magnetic-field vector (h-vector) component of the microwave. In another embodiment, a method comprises providing an array of h-vector detectors, each element of the array being positioned at a different angle with respect to each other, subjecting the array to an external swept quasi-static magnetic field, measuring voltages across terminals of each element of the array when the array receives a microwave, associating each measured voltage with a respective angle, and calculating at least one h-vector component of the microwave.