The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2011
Filed:
Jan. 19, 2006
David T. Gillespie, Pearland, TX (US);
Colin LI Pi Shan, Pearland, TX (US);
Lonnie G. Hazlitt, Lake Jackson, TX (US);
Alexander W. Degroot, Lake Jackson, TX (US);
Peter B. Arnoudse, Lake Jackson, TX (US);
Charles Allen Williams, Richwood, TX (US);
David T. Gillespie, Pearland, TX (US);
Colin Li Pi Shan, Pearland, TX (US);
Lonnie G. Hazlitt, Lake Jackson, TX (US);
Alexander W. DeGroot, Lake Jackson, TX (US);
Peter B. Arnoudse, Lake Jackson, TX (US);
Charles Allen Williams, Richwood, TX (US);
Dow Global Technologies LLC, Midland, MI (US);
Abstract
Apparatus for GPC/TREF and TREF/GPC characterization of a polymer sample. The apparatus provides for the automated and integrated use of multiple TREF columns and a GPC system employing a multiple flow through detectors. In addition, a method for TREF/GPC characterization of a polymer sample by GPC analysis of TREF fractions at increasing TREF elution temperatures from multiple TREF columns operated in a coordinated and synchronized temperature cycle for increased sample throughput. Also, a method for GPC/TREF characterization of a polymer sample by GPC fractionation followed by TREF fractionation of the GPC fractionations.