The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2011

Filed:

Jul. 15, 2009
Applicants:

Yuichi Yoneyama, Nagano-ken, JP;

Tomoaki Kimura, Nagano-ken, JP;

Atsushi Natsuno, Nagano-ken, JP;

Inventors:

Yuichi Yoneyama, Nagano-ken, JP;

Tomoaki Kimura, Nagano-ken, JP;

Atsushi Natsuno, Nagano-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Using detectors, skewed conveyance of sheet media such as checks can be detected accurately regardless of whether part of the conveyed medium is folded over. The biased feed detection unitof a check processing deviceaccording to at least one embodiment of the invention determines the lengths Land Lof the conveyed check(STand ST) and the thickness of a folded part of the check(ST) at different positions perpendicular to the transportation direction based on the output of a paper thickness detectorand a length detectordisposed to the check transportation path. The folded length Lis then subtracted from the difference ΔL of the detected lengths to acquire a corrected difference ΔL(ST). If the corrected difference ΔLis less than or equal to a threshold value D, the medium is determined to be conveyed normally (ST). If the corrected difference ΔLexceeds the threshold value D, the medium is determined to be skewed (ST). Skewed conveyance of the checkcan thus be accurately determined.


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