The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Jan. 19, 2007
Applicants:

Chinsong Sul, Mountain View, CA (US);

Hoon Choi, Mountain View, CA (US);

Gijung Ahn, San Jose, CA (US);

Inventors:

Chinsong Sul, Mountain View, CA (US);

Hoon Choi, Mountain View, CA (US);

Gijung Ahn, San Jose, CA (US);

Assignee:

Silicon Image, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H03M 13/00 (2006.01); H04L 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method, device, and system for testing for errors in high-speed input/output systems. System and device may include a concurrent code checker for checking for errors in encoded data packets through data packets static properties and dynamic properties of the data stream including the packets. Method may involve detecting invalid encoded packets using the data packets static properties and the dynamic properties of the data stream including the packets. Method for optimizing a design of a concurrent code checker logic using don't-care conditions, and concurrent code checker circuit having reduce logic element and semiconductor area requirements.


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