The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Oct. 13, 2006
Applicants:

Bruce C. Munro, Flower Mound, TX (US);

Richard B. Moe, Corinth, TX (US);

Lisa A. Fillebrown, Plano, TX (US);

Nickolia L. Coombs, Dallas, TX (US);

William R. Kelberlau, Georgetown, TX (US);

Richard J. Conz, Seminole, FL (US);

Inventors:

Bruce C. Munro, Flower Mound, TX (US);

Richard B. Moe, Corinth, TX (US);

Lisa A. Fillebrown, Plano, TX (US);

Nickolia L. Coombs, Dallas, TX (US);

William R. Kelberlau, Georgetown, TX (US);

Richard J. Conz, Seminole, FL (US);

Assignee:

Raytheon Company, Waltha, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Analyzing a system includes receiving system performance data indicating performance of one or more sensor systems, operational performance data indicating performance of the sensor systems in one or more scenarios, and cost analysis data indicating one or more cost values associated with the sensor systems. Integrated data is established from the system performance data, the operational performance data, and the cost analysis data. The integrated data is analyzed to establish one or more relationships between at least two of the system performance data, the operational performance data, and the cost analysis data.


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