The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Mar. 11, 2009
Applicant:

Edwin William O'brien, Bristol, GB;

Inventor:

Edwin William O'Brien, Bristol, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure discloses a method of monitoring a structure by a monitoring system including at least one strain gauge positioned on the structure and a computer processor coupled to the at least one strain gauge. According to at least one embodiment, strain data are acquired using the at least one strain gauge, and it is determined, by the computer processor, whether the structure has undergone plastic deformation according to the strain data. Further, a result is outputted according to the determination of plastic deformation.


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