The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

May. 04, 2007
Applicants:

Mitsuhiro Nakano, Hachioji, JP;

Tatsuo Nakata, Hino, JP;

Inventors:

Mitsuhiro Nakano, Hachioji, JP;

Tatsuo Nakata, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a microscope apparatus, used for identifying the cell phases of a plurality of cells mounted on a stage, including an analysis/observation optical system used for acquiring an observed-image of the cells and a stimulus optical system used for applying an optical stimulus to prescribed cells. Using these optical systems, the cell phases of the cells mounted on the stage are identified, an optical stimulus is applied to the cells, and the state of the cells before and after applying the stimulus is observed.


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