The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Nov. 23, 2005
Applicants:

Thomas Louis Toth, Brookfield, WI (US);

Michael Patrick Daly, LaGrange, IL (US);

Inventors:

Thomas Louis Toth, Brookfield, WI (US);

Michael Patrick Daly, LaGrange, IL (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for automatically determining regions in scanned object are provided. The method includes performing a scout scan of an object and automatically determining regions within the object based on attenuation information from the scout scan.


Find Patent Forward Citations

Toth, Thomas. (2011). Method and system for automatically determining regions in a scanned object (U.S. Patent No. 7983457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7983457

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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