The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Sep. 23, 2005
Bimba Rao, San Jose, CA (US);
Danhua Zhao, San Jose, CA (US);
Bimba Rao, San Jose, CA (US);
Danhua Zhao, San Jose, CA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Image processing adapts to speckle. Speckle is identified from signal transitions. For example, peaks, valleys or mean crossings of image signals as a function of space or spatial location are identified. A speckle characteristic, such as speckle size, is estimated from the signal transitions. The estimation may be limited to soft tissue regions to reduce the effects of specular targets and noise on speckle estimation. The speckle is estimated for local regions or an entire image. By estimating speckle for local regions, image processing may account adaptively for regional variation in speckle size.