The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2011
Filed:
Nov. 26, 2008
Brian Thomsen, Milwaukee, WI (US);
John Lawrence Seamans, Ann Arbor, MI (US);
Brian Thomsen, Milwaukee, WI (US);
John Lawrence Seamans, Ann Arbor, MI (US);
General Electric Company, Schenectady, NY (US);
Abstract
Certain embodiments provide a radiation analysis system for material segmentation utilizing computed tomography (CT) scans. The radiation analysis system includes an input module configured to input dual energy data. The dual energy scanned data includes first data corresponding to a first parameter and second data corresponding to a second parameter for a given scanned volume. The radiation analysis system also includes a processor configured to generate a scatter plot based on the dual energy data. The first data corresponds to a first axis and the second data corresponds to a second axis. The processor is configured to identify at least one material type based on the scatter plot.