The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2011

Filed:

Sep. 30, 2009
Applicants:

Christian David, Lauchringen, DE;

Tilman Donath, Brugg, CH;

Eckhard Hempel, Fuerth, DE;

Martin Hoheisel, Erlangen, DE;

Franz Pfeiffer, Brugg, CH;

Stefan Popescu, Erlangen, DE;

Inventors:

Christian David, Lauchringen, DE;

Tilman Donath, Brugg, CH;

Eckhard Hempel, Fuerth, DE;

Martin Hoheisel, Erlangen, DE;

Franz Pfeiffer, Brugg, CH;

Stefan Popescu, Erlangen, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/60 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An x-ray CT system for x-ray phase contrast and/or x-ray dark field imaging has a grating interferometer that has a first grating structure that has a number of band-shaped x-ray emission maxima and minima arranged in parallel, the maxima and minima exhibiting a first grating period, a second band-shaped grating structure that produces, as a phase grating, a partial phase offset of x-ray radiation passing therethrough and that exhibits a second grating period, a third band-shaped grating structure with a third grating period with which relative phase shifts of adjacent x-rays and/or their scatter components are detected, and a device for value-based determination of the phase between adjacent x-rays and/or for value-based determination of the spatial intensity curve per detector element perpendicular to the bands of the grating structures. The third grating structure has a grating period that is larger by a factor of 2 to 5 than the grating period of the first grating structure.


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